Metris rebrands to Nikon Metrology

Leuven, November 10 – After the successful acquisition by Nikon, Metris is rebranded into Nikon Metrology. Under the Nikon brand, Nikon and Metris will synergize their respective strengths with regards to technology, marketing and services, thereby delivering innovative metrology products with a broad application reach to its worldwide customer base. Read the full press release

Visit www.ct-inspection.com or www.metris.com for latest information on Metris X-ray and CT Tomography

LATEST NEWS FROM THE METRIS X-RAY PRODUCT GROUP

XT V 130, the new X-ray inspection system for electronics quality assurance

Leuven, Nov 10th, 2009 – Metris, today rebranded to Nikon Metrology, announces the compact yet versatile XT V 130
X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards.

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Metris Inspect-X 1.6 doubles CT reconstruction speed

Aug 5th, 2009 – Metris, market-leading supplier of X-ray and industrial Computed Tomography systems, launches Inspect-X 1.6 software that boosts throughput by increased CT reconstruction speed and improved general system control. Following Metris’ drive for continual X-ray and CT system improvement, Inspect-X 1.6 further enhances system usability and introduces a faster CT reconstruction engine and support of latest Perkin Elmer panels. Read more.

Metris XT H 450 LC high-power micro-focus computed tomography system brings crystal clear inspection of turbine blades and dense parts

Metris introduces a revolutionary high-power 450kV micro-focus X-ray/CT system for full insight inspection of turbine blades, castings and other dense objects. Its unique 450kV micro-focus source combined with the newly developed Curved Linear Array (CLA) detector maximizes the detection of X-ray flux resulting in industry-leading 25 micron accuracy and repeatability. Read more here

Metris rotating reflection target sets new productivity and performance standards for industrial CT

Metris releases a variant for the industrial 225kV micro-focus X-ray source featuring a rotating reflection target that drastically increases overall CT scanning performance. By establishing up to 5 times more X-ray flux, customers can either speed up data acquisition by a similar factor or increase data accuracy by taking more radiographs in the same time. Read more here

Metris micro-CT scanning unveils mysteries of nature at the Natural History Museum

Researchers of the renowned Natural History Museum in London investigate diverse natural specimens using a Metris micro-CT scanner installed earlier this year. Stunning 3D visualizations of the interior structure of fossils, animals, rocks and meteorites enable them to acquire ground-breaking insight into mineral sedimentary deposits and the evolution of animal anatomy. Read full story

Metris CT-scanner upgrades titanium implant research at National Research Council Canada

Industrial material researchers at the National Research Council Canada (NRC) investigate titanium foam plugs that have been implanted into rabbits. After six weeks, they operate a Metris XT H industrial CT-scanner to visualize bone ingrowth into the porous titanium foam implants. Fast reconstruction of volumetric images enables the researchers to accurately trace where and to what extent bone structure has penetrated into the porous implant. Read full story

 

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