A versatile microfocus x-ray analysis tools for both manual and programmed inspection of samples that demand the highest level of contrast sensitivity.

The Harrier has been developed in direct response to customer requirements using the latest materials technology and X-Tek's 20 years of experience in the design and manufacture of x-ray apparatus.

High Contrast Sensitivity

The Harrier is fitted with the patented X-Tek 160kV Xi "Open Tube" x-ray source and a 60 Watt, air-cooled, 5µm focal spot, Reflection Target.

This source arrangement provides a high contrast imaging capability previously unavailable in a vertical axis X-ray imaging system, making this the ideal system for inspecting low density samples especially IC component packages.

Low Energy Imaging Capability

To improve the low energy imaging capability on samples traditionally considered as having a density too low for x-ray imaging, the Harrier can be specified with a Beryllium Window X-ray Image Intensifier in place of the standard Aluminium Window Intensifier. With this configuration it is possible to image objects with energies as low as 8 kV.

The low energy response can be further improved by the use of hybrid metals targets, extending the Harrier's capabilities to a larger range of bespoke x-ray imaging requirements.

High Resolution Micron Level Features

A tightly controlled microfocus x-ray spot and the latest CCD imager technology ensure that the Harrier produces sharp images of micron level features even in the most challenging samples.

The electron lens is computer controlled to ensure that the image remains in focus at all kV settings and the target does not burn when using high power.

The large carbon fibre tray moves under manual or programme control at up to 60mm/sec in both X and Y directions making the Harrier highly suitable for batch production of smaller components and assemblies.

Trays loaded with samples onto custom fixturing can be snapped in and inspected using a vast library of machine vision functions linked together in quick and easy to compile routines.

With the tray replaced by two precision programmable rotation axes and a custom sample fixture with a scan area of up to 310mm x 500mm, sharp high magnification images from virtually 360 degrees around the sample can be produced.

For component package inspection, standard JEDEC sample trays or complete lots of IC strips can be located into the Harrier’s tray, dedicated software tools measure die attach void percentages and wire sweep rations.

For closer examination, individual strips and tubes can be rotated to expose delamination and wire loop problems.

The Harrier has been designed for ease of use without compromising performance.

Fully adjustable shelves ensure that all system controls are at the operator’s fingertips whether standing or sitting, independent of the person’s height.

The Windows control screen is laid out logically with all regularly used functions in view on single click buttons while movement of the precision joysticks gives a direct and logical response from both sample manipulator and x-ray image.

The system is highly intuitive to operate and as a result, operator training time is significantly reduced.

The Harrier incorporates the most advanced image capture and analysis software. It runs under Windows 2000 on the latest specification processing hardware. The resultant data can be saved or exported directly to MS Word, Excel and any other COM compliant package. Photo quality printouts can be made on a range of inkjet, laser or thermal printers.

Processing hardware and software are both controlled in-house so that advances in technology can be passed on to the user without delay.

IXS includes special functions for inspection of semiconductor package voids, wire bonding and BGA solder bumps. It also makes use of Microsoft Visual Basic as a scripting/macro language, allowing rapid software customisation to suit specific inspection requirements.

Footprint Efficient

The Xi source releases more of the Harrier’s volume for sample manipulation, providing a generous scan area in a system with a footprint of less than one metre square.

Low Ownership Cost

X-Tek’s open x-ray tube development has driven down the size, weight and cost of the system whilst maintaining superior quality and performance. By introducing a patented zero maintenance cable-less HT generator, the preventative maintenance has been dramatically reduced making the long term cost of ownership considerably lower than a sealed tube based system.